Data indexation from the test bench with outlier detection

MOMI 2017
Day: Monday, 27th of February

Alexandre REIFFERS-MASSON
Ph.D, MSc, Ing

Title:
Data indexation from the test bench with outlier detection

Contact:

SAFRAN
alexandre.reiffers-masson@safrangroup.com

Abstract:
Safran is interested in the creation of tools for the indexation and analysis of test bench signals. Data are extracted from benches used in the conception and production phase. Indeed, when a failure occurs, we need to have a fast access to this data in order to able to know the origin of the failure.

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